ADVANCED IMAGING FOR
Atomic Vision for
Next-generation
Quantum Devices
Fast imaging technologies for exploring atomic motion and spin dynamics in advanced materials.
What our instruments resolve
Three things have to be true at once for a measurement to be useful on a modern device: it has to reach the right length scale, the right time scale, and the right degree of freedom.
01 / The Challenge
Devices got smaller and faster than the tools used to study them.
Most imaging gives you a material at rest. Devices fail in motion.
Transistors are now a few nanometres across, and a qubit’s coherence can hinge on a defect a few atoms wide. At that scale, the events that decide whether a device works — a bond breaking, a domain flipping, heat moving through an interface — are both too small and too brief for conventional imaging to catch.
The result is familiar to anyone doing failure analysis: a beautiful static image of a structure, and no information about the picosecond in which it went wrong.
If you cannot see the process, you are tuning it blind — one wafer, one fabrication run, one guess at a time.
02 / Technology
Where this is used
We work with teams whose next design decision depends on a measurement they cannot currently make.
Semiconductor process development
Find the step that damages the film
Compare structural response across process variants and see which deposition or anneal step leaves the lattice disturbed, before it shows up as yield loss.
Quantum device materials
Understand what limits coherence
Compare structural response across process variants and see which deposition or anneal step leaves the lattice disturbed, before it shows up as yield loss.
Spintronics and magnetic memory
Find the step that damages the film
Compare structural response across process variants and see which deposition or anneal step leaves the lattice disturbed, before it shows up as yield loss.
2D and layered materials
Find the step that damages the film
Compare structural response across process variants and see which deposition or anneal step leaves the lattice disturbed, before it shows up as yield loss.
03 / About
About SESARC
We are an instrumentation company, built around one measurement probl
The team’s background is in ultrafast imaging and materials physics. We are working with early partners on real samples rather than model systems, because an instrument that only performs on a clean reference crystal is not much use in a fab.
If your roadmap depends on knowing what your material does in the first nanosecond, we would like to hear about it.
04 / Contact Us
Tell us what you need to see
Describe the material, the process and the time scale you care about. We will tell you honestly whether our instruments can reach it — and if they cannot yet, what would need to change.
SESARC fast imaging technology for electronics device manufacturers and quantum computing companies. Our instruments provide insight to atomic motion and spin dynamics inside materials.